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The Scintag X-ray Diffractometer, housed in the
Department of Geology and Geophysics, ApplicationsX-ray powder diffraction is used to examine the crystalline structure of solid materials. It is used to identify individual compounds or compounds present in mixtures, to refine crystalline structures of compounds, and to measure abundances of compounds in mixtures. InstrumentationWe have a SCINTAG XDS2000 automated powder diffraction system equipped with a theta-theta goniometer and a solid state xray detector. The system is operated through a Microvax computer, and is supported by extensive software for data acquisition and processing including background subtraction , peak recognition, automated search-match procedures for phase identification, crystallography routines including peak indexing and unit cell refinements, automated quantitative analysis of mixtures, and crystallite size determination. Rietveld refinement software is also available in this lab. The system is capable of running up to 7 samples in a fully automated (unattended) batch mode. Sample RequirementsRoutine operation utilizes 0.05 to 0.10 grams of finely powdered sample. The sample is not damaged during analysis and can be fully recovered. This instrument has a horizontal sample stage, so liquids with suspended crystalline material could also be examined. Coarse grained and single crystal samples can be examined using special techniques.
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