The Scanning Electron Microscope,
in the Department of Geology & Geophysics, at the
University of Wyoming.
Applications
Scanning Electron Microscopes (SEMs) are
optimized for imaging and analysis of shapes and spatial variations in features, such as
chemical composition. The most familiar application of SEMs is in generating photos
of extremely small details on almost any kind of sample.
Instrumentation
We have two SEMs in our laboratories. Our
"flagship" instrument is a new JEOL5800LV microscope equipped with a
backscattered electron detector, a cathodoluminescence detector, and a light-element
energy dispersive xray
detector (capable of detection of elements with atomic number of 5 or greater) in addition
to the standard
secondary electron detector. This microscope is fully interfaced with a NORAN Voyager
image acquisition
and analysis system operated through a SUN sparc workstation. In addition to routine
high-vacuum
operation, this microscope is capable of operation in a "low vacuum" (a.k.a.
"environmental") mode which
enables examination of samples without application of a conductive coating, and
examination of samples
under somewhat lower vacuum conditions. Our second SEM is an older JEOL35CF equipped with
a
secondary electron detector and a new digital scan grabbing system which enables
acquisition of digital
images suitable for sophisticated image analysis, etc. This is a basic but highly
reliable piece of equipment.
Sample Requirements
Almost any solid material stable in a vacuum can be
examined in either SEM. Some samples require
significant preparation, but most can be examined almost "as is". Ask us
about YOUR samples.
